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OMAP-L138: Solution to ESD problem that contrasts with TI suggested layout. Any consequences?

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Part Number:OMAP-L138

Recently we faced a problem with an OMAP-L138 during ESD tests (specifically for contact discharge).

Knowing that there could be an issue with the core clock, we investigated this specific part of the circuit.

We use a 24 MHz crystal, but attempts to supply the clock from an external oscillator (as TI suggests) did not help.

Eventually, we solved the problem by connecting the oscillator ground to the digital ground of the rest of the circuit. According to TI documentation, this is not recommended, nonetheless we did not notice any problem or performance degradation.

So, what happens when oscillator and digital ground are connected together? Should we expect any problems in the future?

I hope that experts can give us a better understanding!

Giuseppe


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