Part Number:TDA3XEVM
In the TI document for TDA3, it was said that CFAR CA detector equation is : CUT > Threshold*NoiseFloor without any other explanations. I have the following questions given each cell of RDM has complex number.
1. Does CUT in the aforementioned equation use the power of the cell under test or the log value of the power?
2. If the log is used for CUT, is the noise floor calculated based on the power of neighboring cells or the log value of the power?